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0488135 - FZÚ 2018 RIV GB eng J - Journal Article
Kohn, V.G. - Khikhlukha, Danila
Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I.
Acta Crystallographica Section A-Foundation and Advances. Roč. 72, May (2016), s. 349-356. ISSN 2053-2733. E-ISSN 2053-2733
R&D Projects: GA MŠMT EF15_008/0000162; GA MŠMT ED1.1.00/02.0061
Grant - others:ELI Beamlines(XE) CZ.02.1.01/0.0/0.0/15_008/0000162; ELI Beamlines(XE) CZ.1.05/1.1.00/02.0061
Institutional support: RVO:68378271
Keywords : X-ray diffraction * silicon crystal * six-beam diffraction * section topography * computer simulations
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 5.725, year: 2016
Permanent Link: http://hdl.handle.net/11104/0282752