0481591 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk - Polčák, J. - Paták, Aleš - Lejeune, M.Examination of 2D crystals in a low voltage SEM/STEM.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 618-619. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low voltage SEM/STEM * 2D crystals * contamination
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0277164
