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0477368 - ÚMCH 2018 CH eng A - Abstract
Coufalová, E. - Pavlova, Ewa - Šlouf, Miroslav - Štěpán, P. - Drštička, M. - Kolařík, V. - Hozák, Pavel
Comparison of LVEM5, LVEM25 and standard TEM.
Proceedings. Lausanne: Swiss Society for Optics and Microscopy, 2017. s. 507-508.
[Microscopy Conference. 21.08.2017-25.08.2017, Lausanne]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:61389013 ; RVO:68378050
Keywords : electron microscopy * nanostructure of materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0274188