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0477366 - ÚMCH 2018 US eng A - Abstract
Wandrol, P. - Šlouf, Miroslav
Polymer imaging in SEM - charge, damage and coating free.
Microscopy and Microanalysis. Cambridge University Press. Roč. 23, S1 (2017), s. 1816-1817. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis. 06.08.2017-10.08.2017, St. Louis]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:61389013
Keywords : polymer * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0280079