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    0469204 - ÚFP 2017 RIV US eng J - Journal Article
    Germer, S. - Pietag, F. - Polák, Jaroslav - Arnold, T.
    Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
    Review of Scientific Instruments. Roč. 87, č. 11 (2016), č. článku 113301. ISSN 0034-6748. E-ISSN 1089-7623.
    [Topical Conference on High-Temperature Plasma Diagnostics/21./. Madison, 05.06.2016-09.06.2016]
    Institutional support: RVO:61389021
    Keywords : Current density * Etching * Faraday cups * Ion beam sources * Cameras
    OECD category: 2.11 Other engineering and technologies
    Impact factor: 1.515, year: 2016
    http://aip.scitation.org/doi/full/10.1063/1.4964701
    Permanent Link: http://hdl.handle.net/11104/0267029
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    Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.pdf23.5 MBPublisher’s postprintrequire
     
     

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