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0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Reflected and transmitted mode in the scanning low energy electron microscope.
2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
[Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0265401