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0465457 - ÚPT 2017 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk
Practical Use of Scanning Low Energy Electron Microscope (SLEEM).
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1650-1651. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy * SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.891, year: 2016
Permanent Link: http://hdl.handle.net/11104/0264011