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0465340 - ÚPT 2017 RIV GB eng C - Conference Paper (international conference)
Skoupý, Radim - Krzyžánek, Vladislav - Nebesářová, Jana
Plasma cleaning effect on the stability of the Epon resin sections.
EMC2016. The 16th European Microscopy Congress. Proceedings. Oxford: Wiley, 2016, s. 597-598. ISBN 9783527808465.
[EMC2016. European Microscopy Congress /16./. Lyon (FR), 28.08.2016-02.09.2016]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * plasma cleaning
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering; JA - Electronics ; Optoelectronics, Electrical Engineering (BC-A)
http://onlinelibrary.wiley.com/doi/10.1002/9783527808465.EMC2016.5995/pdf
Permanent Link: http://hdl.handle.net/11104/0263960