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0465206 - ÚPT 2017 RIV US eng J - Journal Article
Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections.
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 926-927. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : TEM * STEM * EFTEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering; JA - Electronics ; Optoelectronics, Electrical Engineering (BC-A)
Impact factor: 1.891, year: 2016
Permanent Link: http://hdl.handle.net/11104/0263873