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0463238 - FZÚ 2017 RIV NL eng J - Journal Article
Romanyuk, Olexandr - Bartoš, Igor - Brault, J. - De Mierry, P. - Paskova, T. - Jiříček, Petr
GaN quantum dot polarity determination by X-ray photoelectron diffraction.
Applied Surface Science. Roč. 389, Dec (2016), s. 1156-1160. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GA15-01687S; GA MŠMT LM2015088
Institutional support: RVO:68378271
Keywords : GaN * semipolar GaN * quantum dots * X-ray photoelectron diffraction * surface polarity
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.387, year: 2016
Permanent Link: http://hdl.handle.net/11104/0262652