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  1. 1.
    0460199 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
    Very low energy STEM/TOF system.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 6-7. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : elecvtron microscopy * SLEEM * UHV SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260331