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  1. 1.
    0458106 - FZÚ 2016 RIV CZ eng V - Research Report
    Vaněček, Milan - Holovský, Jakub - Poruba, Aleš - Remeš, Zdeněk - Purkrt, Adam
    Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass.
    Praha: Tel Solar AG, Trübbach, Switzerland, 2015. 22 s.
    Source of funding: N - neveřejné zdroje
    Keywords : optical properties * amorphous silicon * microcrystalline silicon * ZnO
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0258426