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0452286 - ÚPT 2016 DE eng C - Conference Paper (international conference)
Krzyžánek, Vladislav - Skoupý, Radim - Hrubanová, Kamila - Kočová, L. - Nebesářová, Jana
Influence of ultrathin resin section aging and its reduction for imaging in the low voltage STEM.
MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, s. 817-818.
[Microscopy Conference 2015. Göttingen (DE), 06.09.2015-11.09.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * ultrathin resin
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253311