0452276 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, JanaElectron beam induced mass loss dependence on aging of Epon resin sections.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * mass loss * resin * Epon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253305
