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0449460 - FZÚ 2016 RIV CH eng J - Journal Article
Jirásek, Vít - Ižák, Tibor - Varga, Marián - Babchenko, Oleg - Kromka, Alexander
Investigation of residual stress in structured diamond films grown on silicon.
Thin Solid Films. Roč. 589, Aug (2015), 857-863. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR(CZ) GP14-16549P
Institutional support: RVO:68378271
Keywords : CVD diamond * thermal stress * selective area deposition * FEM simulations
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.761, year: 2015
Permanent Link: http://hdl.handle.net/11104/0251001