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0448611 - ÚPT 2016 DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Mika, Filip - Müllerová, Ilona - Krátký, Stanislav
Band-pass-filter for secondary electrons in ultra-high resolution SEM.
MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, s. 378-379.
[Microscopy Conference 2015. Göttingen (DE), 06.09.2015-11.09.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : Band-pass-filter * SEM * ultra-high resolution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0250356