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0444439 - ÚPT 2016 RIV CH eng J - Journal Article
Lazar, Josef - Klapetek, P. - Valtr, M. - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej - Čížek, Martin - Oulehla, Jindřich - Šerý, Mojmír
Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy.
Sensors. Roč. 14, č. 1 (2014), s. 877-886. E-ISSN 1424-8220
R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : nanometrology * nanopositioning interferometry * AFM * nanoscale
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.245, year: 2014
Permanent Link: http://hdl.handle.net/11104/0246959