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0432247 - FZÚ 2015 RIV DE eng J - Journal Article
Hývl, Matěj
AFM measurements of novel solar cells. Studying electronic properties of Si-based radial junctions.
G.I.T. Imaging and Microscopy. -, č. 1 (2014), s. 52-53. ISSN 1439-4243
R&D Projects: GA ČR GA13-25747S; GA ČR GA13-12386S; GA MŠMT(CZ) LM2011026
Institutional support: RVO:68378271
Keywords : AFM measurements * conductive cantilever * electronic properties * nanowires * PF TUNA
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.imaging-git.com/science/scanning-probe-microscopy/afm-measurements-novel-solar-cells
Permanent Link: http://hdl.handle.net/11104/0236681