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0425306 - FZÚ 2014 RIV US eng J - Journal Article
Jirásek, V. - Ižák, Tibor - Babchenko, Oleg - Kromka, Alexander - Vanko, G.
Modeling of thermal stress induced during the diamond-coating of AlGaN/GaN high electron mobility transistors.
Advanced Science, Engineering and Medicine. Roč. 5, č. 6 (2013), s. 522-526. ISSN 2164-6627
R&D Projects: GA ČR(CZ) GBP108/12/G108
Institutional support: RVO:68378271
Keywords : gallium nitride * HEMT * nano-crystalline diamond * selective diamond growth
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://dx.doi.org/10.1166/asem.2013.1324.
Permanent Link: http://hdl.handle.net/11104/0231205