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    1.
    0398028 - ÚPT 2014 RIV US eng J - Journal Article
    Frank, Luděk - Mikmeková, Šárka - Pokorná, Zuzana - Müllerová, Ilona
    Scanning Electron Microscopy With Slow Electrons.
    Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 372-373. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118
    Institutional support: RVO:68081731
    Keywords : Scanning Electron Microscopy * Slow Electrons * Grain Contrast * Contrast of the Density of States * Angle-resolved BSE
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.161, year: 2013
    Permanent Link: http://hdl.handle.net/11104/0225603
     
     

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