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0395132 - ÚFE 2014 RIV GB eng J - Journal Article
Yatskiv, Roman - Grym, Jan
Thermal stability study of semimetal graphite n-InP and n-GaN Schottky diodes.
Semiconductor Science and Technology. Roč. 28, č. 5 (2013). ISSN 0268-1242. E-ISSN 1361-6641
R&D Projects: GA MŠMT LD12014
Institutional support: RVO:67985882
Keywords : Gallium nitride * Schottky barrier diodes * Graphite
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.206, year: 2013
Permanent Link: http://hdl.handle.net/11104/0223260