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0390947 - FZÚ 2013 JP eng A - Abstract
Ledinský, Martin - Vetushka, Aliaksi - Stuchlík, Jiří - Rezek, Bohuslav - Fejfar, Antonín - Kočka, Jan
Microcrystalline silicon thin films studied by photoconductive atomic force microscopy.
ICANS 24. Program and Abstracts Book. Nara, 2011. s. 233-233.
[International Conference on Amorphous and Nanocrystalline Semiconductors /24./ - ICANS 24. 21.08.2011-26.08.2011, Nara]
Institutional research plan: CEZ:AV0Z10100521
Keywords : amorphous silicon * nanocrystalline silicon * thin films * atomic force microscopy * photoconductivity
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0219806