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0386854 - FZÚ 2013 RIV NL eng J - Journal Article
Ledinský, Martin - Fejfar, Antonín - Vetushka, Aliaksi - Stuchlík, Jiří - Kočka, Jan
Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy.
Journal of Non-Crystalline Solids. Roč. 358, č. 17 (2012), s. 2082-2085. ISSN 0022-3093. E-ISSN 1873-4812.
[International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS) /24./. Nara, 21.08.2011-26.08.2011]
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701
Grant - others:7. Framework programme of the European Community(XE) no. 240826
Institutional research plan: CEZ:AV0Z10100521
Keywords : amorphous and nanocrystalline silicon films * atomic force microscopy (AFM) * local photoconductivity
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.597, year: 2012
http://www.sciencedirect.com/science/article/pii/S0022309312000178
Permanent Link: http://hdl.handle.net/11104/0216097