0386621 - FZÚ 2013 RIV DE eng C - Conference Paper (international conference)
Ledinský, Martin - Hakl, M. - Ondič, Lukáš - Ganzerová, K. - Vetushka, Aliaksi - Fejfar, Antonín - Kočka, JanLight trapping abilities of silicon thin films measured by Raman spectroscopy.
Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 - (Nowak, S.), s. 2431-2433. ISBN 3-936338-28-0.
[European Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./. Frankfurt (DE), 24.09.2012-28.09.2012]
R&D Projects: GA MŠMT 7E10061; GA MŠMT(CZ) LM2011026; GA MPO FR-TI2/736
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : light trapping * polycrystalline silicon (Si) * thin film solar cell * Raman spectoscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0215916
