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0384139 - FZÚ 2013 eng A - Abstract
Fejfar, Antonín
Microscopic study of silicon thin films.
[NANOCON 2011. International Conference /3./. 21.09.2011-23.09.2011, Brno]
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : silicon * scanning probe methods * solar cells
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0213873