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0379918 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Mikmeková, Šárka - Matsuda, K. - Müllerová, Ilona - Frank, Luděk
Backscattered electrons in examination of materials.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : scanning electron microscope * backscattered electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210769