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0375338 - FZÚ 2012 CZ eng D - Thesis
Vetushka, Aliaksi
Mechanical and electrical properties of microcrystalline silicon thin films.
Matematicko-fyzikální fakulta UK. Defended: Matematicko-fyzikální fakulta UK. 29.03.2011. - Praha: Univerzita Karlova, 2010. 86 s.
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT LC510
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : conductive atomic force microscopy * raman micro-spectroscopy * microcrystalline silicon
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://dl.dropbox.com/u/26071625/AV_PhD.pdf
Permanent Link: http://hdl.handle.net/11104/0208019