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0375317 - FZÚ 2012 RIV DE eng C - Conference Paper (international conference)
Fejfar, Antonín - Vetushka, Aliaksi - Ledinský, Martin - Kočka, Jan
Microscopic measurements of polycrystalline silicon thin films on glass.
Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP München, 2011, s. 2788-2790. ISBN 3-936338-27-2.
[European Photovoltaic Solar Energy Conference and Exhibition /26./. Hamburg (DE), 05.09.2011-09.09.2011]
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510; GA AV ČR(CZ) IAA100100902
EU Projects: European Commission(XE) 240826 - PolySiMode
Institutional research plan: CEZ:AV0Z10100521
Keywords : Si-films * polycrystalline Si * microcrystalline Si
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0208002