0375054 - FZÚ 2012 RIV US eng C - Conference Paper (international conference)
Fejfar, Antonín - Klapetek, P. - Zlámal, J. - Vetushka, Aliaksi - Ledinský, Martin - Kočka, JanMicroscopic characterizations of nanostructured silicon thin films for solar cells.
Amorphous and Polycrystalline Thin-Film Silicon Science and Technology. Warrendale: MRS, 2011 - (Yan, B.; Higashi, S.; Tsai, C.; Wang, Q.; Gleskova, H.), s. 313-321. MRS Symposium Proceeding, 1321. ISBN 9781605112985.
[Materials Research Society Spring Meeting. San Francisko (US), 25.04.2011-29.04.2011]
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT LC510
Grant - others:7. Framework programme EU(XE) no. 240826
Institutional research plan: CEZ:AV0Z10100521
Keywords : silicon * scanning probe methods * solar cells
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0207821
