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0367893 - ÚPT 2012 RIV CH eng C - Conference Paper (international conference)
Mikmeková, Šárka - Man, O. - Pantělejev, L. - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Kouřil, M.
Strain Mapping by Scanning Low Energy Electron Microscopy.
Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). Zurich: Trans Tech Publications, 2011 - (Šandera, P.), s. 338-341. ISBN 978-3-03785-006-0. ISSN 1662-9795.
[MSMF-6: Materials Structure and Micromechanics of Fracture VI. Brno (CZ), 28.06.2010-30.06.2010]
R&D Projects: GA AV ČR IAA100650902; GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy (SLEEM) * contrast of crystal orientation * microscopic strain
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0202409