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0367235 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Frank, Luděk - Pokorná, Zuzana - Mikmeková, Šárka - Müllerová, Ilona
Backscattered electrons in the SEM imaging.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 65-66.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP108/11/2270
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * BSE * low energy * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201981