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0359300 - FZÚ 2012 RIV US eng J - Journal Article
Chalupský, Jaromír - Krzywinski, J. - Juha, Libor - Hájková, Věra - Cihelka, Jaroslav - Burian, Tomáš - Vyšín, Luděk - Gaudin, J. - Gleeson, A. - Jurek, M. - Khorsand, A.R. - Klinger, D. - Wabnitz, H. - Sobierajski, R. - Störmer, M. - Tiedtke, K. - Toleikis, S.
Spot size characterization of focused non-Gaussian X-ray laser beams.
Optics Express. Roč. 18, č. 26 (2010), s. 27836-27845. ISSN 1094-4087
R&D Projects: GA AV ČR KAN300100702; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA ČR GAP208/10/2302; GA MŠMT LA08024; GA AV ČR IAAX00100903; GA MŠMT(CZ) ME10046
Institutional research plan: CEZ:AV0Z10100523
Keywords : X-ray laser * free-electron laser * beam characterization * ablation
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 3.749, year: 2010
Permanent Link: http://hdl.handle.net/11104/0197107