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0353131 - FZÚ 2011 RIV GB eng J - Journal Article
Ge, Y. - Heczko, Oleg - Hannula, S.-P. - Fähler, S.
Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements.
Acta Materialia. Roč. 58, č. 20 (2010), 6665-6671. ISSN 1359-6454. E-ISSN 1873-2453
Grant - others:AVČR(CZ) M100100913
Institutional research plan: CEZ:AV0Z10100520
Keywords : reciprocal space mapping * thin film * Ni–Mn–Ga * martensite * magnetic shape memory
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 3.781, year: 2010
Permanent Link: http://hdl.handle.net/11104/0192458