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0353046 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * scintillation detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192396