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0352939 - ÚPT 2011 US eng A - Abstract
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Scanning transmission low energy electron microscopy.
The 7th International Workshop on LEEM/PEEM. New York: IBM T.J. Watson Research Center, 2010. s. 25.
[LEEM/PEEM /7./. 08.08.2010-13.08.2010, New York]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscope * he low energy electron microscope * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192317