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0352422 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Advances in Low Energy Scanning Electron Microscopy.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, s. 256-257. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron microscopy * cathode lens * slow backscattered electrons * STEM * VLESTEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191930