0352207 - ÚPT 2011 RIV US eng C - Conference Paper (international conference)
Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, MartinLaser source for interferometry in nanotechnology.
17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proceedings of SPIE Vol. 7746). Bellingham: SPIE, 2010, 77461I: 1-6. ISBN 978-0-8194-8236-5.
[Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /17./. Liptovsky Jan (SK), 06.09.2010]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Institutional research plan: CEZ:AV0Z20650511
Keywords : atomic force microscopy * nanometrology * interferometry
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191774
