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0347762 - FZÚ 2011 RIV DE eng J - Journal Article
Vetushka, Aliaksi - Fejfar, Antonín - Ledinský, Martin - Rezek, Bohuslav - Stuchlík, Jiří - Kočka, Jan
Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films.
Physica Status Solidi C. Roč. 7, 3-4 (2010), s. 728-731. ISSN 1862-6351
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510; GA AV ČR(CZ) IAA100100902
Institutional research plan: CEZ:AV0Z10100521
Keywords : local anodic oxidation (LAO) * conductive atomic force microscopy (C-AFM)
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www3.interscience.wiley.com/journal/123289759/abstract
Permanent Link: http://hdl.handle.net/11104/0188465