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0346294 - ÚACH 2011 DK eng A - Abstract
Bezdička, Petr - Kotulanová, Eva - Klementová, Mariana
Quantitative phase analysis of model painting layers : A comparasion of X-ray micro-diffraction with conventional transmission and reflection geometries.
Acta Crystallographica Section A. Oxford Blackwell. Roč. 65, suppl - abstracts (2009), s. 191. ISSN 0108-7673. E-ISSN 2053-2733.
[European Crystalographic Meeting /25./. 16.08.2009-21.08.2009, Istanbul]
Institutional research plan: CEZ:AV0Z40320502
Keywords : micro-diffraction * quantitative phase analysis * art-works
Subject RIV: CA - Inorganic Chemistry
Permanent Link: http://hdl.handle.net/11104/0187362