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  1. 1.
    0338185 - FZÚ 2010 RIV NL eng A - Abstract
    Holovský, Jakub - Ižák, T. - Poruba, Aleš - Vaněček, Milan - Hamers, E.A.G.
    Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates.
    [Fourierovské fotovodivostní měření tenkých vrstev amorfního křemíku na hrubých opticky neprůhledných a vodivých substrátech.]
    ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. Utrecht: Utrecht University, 2009. s. 332-332. ISBN N.
    [International Conference on Amorphous and Nanocrystaline Semiconductors /23./ (ICANS23). 23.08.2009-28.08.2009, Utrecht]
    R&D Projects: GA ČR GA202/09/0417
    EU Projects: European Commission(XE) 38885 - SE-POWERFOIL
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : thin film silicon * photoconductivity * optical modeling
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0182026
     
     

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