0336002 - FZÚ 2010 RIV US eng C - Conference Paper (international conference)
Bajt, S. - Chapman, H.N. - Nelson, A.J. - Lee, R. W. - Toleikis, S. - Mirkarimi, P. - Alameda, J.B. - Baker, S. L. - Vollmer, H. - Graff, R.T. - Aquila, A. - Gullikson, E.M. - Meyer Ilse, J. - Spiller, E.A. - Krzywinski, J. - Juha, Libor - Chalupský, Jaromír - Hájková, Věra - Hajdu, J. - Tschentscher, T.Sub-micron focusing of soft x-ray free electron laser beam.
[Mikrofokusace svazku měkkého rentgenového laseru s volnými elektrony.]
Damage to VUV, EUV, and X-ray Optics II. Bellingham: SPIE, 2009 - (Juha, L.; Bajt, S.; Sobierajski, R.), 73610J/1-73610J/10. Proceedings of SPIE, 7361. ISBN 9780819476357. ISSN 0277-786x.
[Damage to VUV, EUV, and X-Ray Optics II. Prague (CZ), 21.04.2009-23.04.2009]
R&D Projects: GA AV ČR KAN300100702; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA MŠMT LA08024; GA AV ČR IAA400100701
Institutional research plan: CEZ:AV0Z10100523
Keywords : microfocuses * multilayer mirror * free electron laser beam
Subject RIV: BH - Optics, Masers, Lasers
http://dx.doi.org/10.1117/12.822498
Permanent Link: http://hdl.handle.net/11104/0180334
