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0335270 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Schauer, P. - Schauer, Petr - Kuřitka, I. - Nešpůrek, Stanislav
Cathodoluminescence study of electron beam formed defects in polysilanes.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 3: 383-384. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA AV ČR IAA100100622
Institutional research plan: CEZ:AV0Z20650511; CEZ:AV0Z40500505
Keywords : cathodoluminescence * electron beam degradation * poly[methyl(phenyl)silane] * PMPSi * silicon polymers
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/55161.pdf
Permanent Link: http://hdl.handle.net/11104/0179779