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0333617 - ÚPT 2010 RIV GB eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo
Collection of secondary electrons in scanning electron microscopes.
Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA MŠMT OE08012; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection of electrons * magnetic lenses * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.612, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178559