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    0315789 - ÚJF 2009 DE eng A2 - Proceedings Abstract
    Macková, Anna - Bočan, Jiří - Khaibullin, R. I. - Švorčík, V. - Slepička, P. - Siegel, J. - Valeev, V. F.
    RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI.
    [RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI.]
    16th International Conference on Ion Beam Modification of Materials Book of Abstracts. Dresden: Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008. s. 317-317.
    [16th International Conference on Ion Beam Modification of Materials. 31.08.2008-05.09.2008, Dresden]
    R&D Projects: GA AV ČR(CZ) KJB100480601; GA MŠk(CZ) LC06041
    Institutional research plan: CEZ:AV0Z10480505
    Keywords : ion implantation in polymers * TRIDYN * Ion Beam Analysis * UV-VIS, XPS
    Subject RIV: JI - Composite Materials
    Permanent Link: http://hdl.handle.net/11104/0165889