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0205650 - UPT-D 20030032 RIV HR eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Wandrol, Petr - Špinka, Jiří
Detection of backscattered electrons in environmental scanning electron microscope.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 489 - 490
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : collection angle * signal level * detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101263