Basket

0205647 - UPT-D 20030029 RIV HR eng C - Conference Paper (international conference)
Schauer, Petr - Nešpůrek, Stanislav - Schauer, F. - Autrata, Rudolf
Electron beam degradation study of silicon polymers.
Proceedings of the 6th Multinational Congress on Microscopy - European Extension. Zagreb: Croatian Society for Electron Microscopy, 2003 - (Milat, O.; Ježek, D.), s. 205 - 206
[MCEM. Pula (HR), 01.06.2003-05.06.2003]
R&D Projects: GA ČR GA202/01/0518
Institutional research plan: CEZ:AV0Z4050913; CEZ:AV0Z2065902
Keywords : cathodoluminescence * degradation * polymer
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101260