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0205642 - UPT-D 20030024 RIV US eng J - Journal Article
Müllerová, Ilona - Frank, Luděk
Contrast Mechanisms in the Scanning Low Energy Electron Microscopy.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 120 - 121. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IPP1050128; GA AV ČR IAA1065304
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscope * primary electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101255