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0205509 - UPT-D 20020059 RIV CZ eng C - Conference Paper (international conference)
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
X-ray microanalysis in ESEM and LV SEM.
Proceedings of the 8^th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 51 - 54. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : primary electron * low vacuum * electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101122