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0205091 - UPT-D 980069 RIV US eng J - Journal Article
Müllerová, Ilona - Zadražil, Martin - Frank, Luděk
Low-energy SEM imaging of bevelled multilayers.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 121-122. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
R&D Projects: GA ČR GA202/95/0280
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100711