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0205085 - UPT-D 980021 RIV GB eng C - Conference Paper (international conference)
El Gomati, M. M. - Assa'd, A. M. D. - El Gomati, T. - Zadražil, Martin
On the measurement of low energy backscattered and secondary electron coefficients.
Electron Microscopy and Analysis 1997 - Proceedings of the Institute of Physics Conference (Series Number 153, Section 7). Bristol: Institute of Physics Publishing Ltd., 1997 - (Rodenburg, J.), s. 265-268. ISBN 0-7503-0441-3.
[EMAG '97 - Electron Microscopy and Analysis Conference. Cambridge (GB), 02.09.1997-05.09.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100705